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Room-Temperature Single-Electron Charging Detected by Electrostatic Force Microscopy
Tekiel, Antoni, Miyahara, Yoichi, Topple, Jessica M., Grutter, PeterVolume:
7
Language:
english
Journal:
ACS Nano
DOI:
10.1021/nn401840n
Date:
May, 2013
File:
PDF, 3.73 MB
english, 2013