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[IEEE International Electron Devices Meeting. Technical Digest. IEDM - San Francisco, CA, USA (10-13 Dec. 2000)] International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) - Impact of process scaling on 1/f noise in advanced CMOS technologies
Knitel, M.J., Woerlee, P.H., Scholten, A.J., Zegers-Van Duijnhoven, A.Year:
2000
Language:
english
DOI:
10.1109/IEDM.2000.904356
File:
PDF, 312 KB
english, 2000