![](/img/cover-not-exists.png)
Interconnect Design Challenges in Nano CMOS Circuit
Masu, Kazuya, Amakawa, Shuhei, Ito, Hiroyuki, Ishihara, NoboruVolume:
470
Language:
english
Journal:
Key Engineering Materials
DOI:
10.4028/www.scientific.net/KEM.470.224
Date:
February, 2011
File:
PDF, 433 KB
english, 2011