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ToF-SIMS Depth Profiling of Cells: z -Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts
Robinson, Michael A., Graham, Daniel J., Castner, David G.Volume:
84
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac300480g
Date:
June, 2012
File:
PDF, 3.57 MB
english, 2012