Adhesion Forces in Conducting Probe Atomic Force Microscopy

Langmuir 2003 / 03 Vol. 19; Iss. 6

Adhesion Forces in Conducting Probe Atomic Force Microscopy

Tivanski, Alexei V., Bemis, Jason E., Akhremitchev, Boris B., Liu, Haiying, Walker, Gilbert C.
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Volume:
19
Language:
english
Journal:
Langmuir
DOI:
10.1021/la026555k
Date:
March, 2003
File:
PDF, 94 KB
english, 2003
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