Gate-Induced Carrier Delocalization in Quantum Dot Field...

Nano Letters 2014 / 10 Vol. 14; Iss. 10

Gate-Induced Carrier Delocalization in Quantum Dot Field Effect Transistors

Turk, Michael E., Choi, Ji-Hyuk, Oh, Soong Ju, Fafarman, Aaron T., Diroll, Benjamin T., Murray, Christopher B., Kagan, Cherie R., Kikkawa, James M.
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Volume:
14
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl5029655
Date:
October, 2014
File:
PDF, 949 KB
english, 2014
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