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[IEEE ICMTS 2002. 2003 International Conference on Microelectronic Test Structures - Monterey, CA, USA (17-20 March 2003)] International Conference on Microelectronic Test Structures, 2003. - Characterization and modeling of MOSFET mismatch of a deep submicron technology
Quarantelli, M., Saxena, S., Dragone, N., Babcock, J.A., Hess, C., Minehane, S., Winters, S., Jianjun Chen,, Karbasi, H., Guardiani, C.Year:
2003
Language:
english
DOI:
10.1109/ICMTS.2003.1197468
File:
PDF, 379 KB
english, 2003