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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - An analytical model of the effect of external DC magnetic fields on the AC voltages of an LVDT

Martino, Michele, Golluccio, Giancarlo, Losito, Roberto, Masi, Alessandro
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Year:
2010
Language:
english
DOI:
10.1109/IMTC.2010.5488116
File:
PDF, 1.02 MB
english, 2010
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