Electrical Properties of Anodically Oxidized Nb 2 O 5 and Si-Doped Nb 2 O 5 Films
Shimizu, Hirofumi, Sato, Hirohumi, Nishimura, Shigeoki, Honda, MitsutoshiVolume:
44
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.44.6664
Date:
September, 2005
File:
PDF, 302 KB
english, 2005