Estimation of the uncertainty for a phase noise optoelectronic metrology system
Salzenstein, P, Pavlyuchenko, E, Hmima, A, Cholley, N, Zarubin, M, Galliou, S, Chembo, Y K, Larger, LVolume:
T149
Language:
english
Journal:
Physica Scripta
DOI:
10.1088/0031-8949/2012/T149/014025
Date:
May, 2012
File:
PDF, 274 KB
english, 2012