Cross-Layer Modeling and Simulation of Circuit Reliability

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2014 / 01 Vol. 33; Iss. 1

Cross-Layer Modeling and Simulation of Circuit Reliability

Cao, Yu, Velamala, Jyothi, Sutaria, Ketul, Chen, Mike Shuo-Wei, Ahlbin, Jonathan, Esqueda, Ivan Sanchez, Bajura, Michael, Fritze, Michael
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Volume:
33
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2013.2289874
Date:
January, 2014
File:
PDF, 1.31 MB
english, 2014
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