Variation-Aware Aging Analysis in Digital ICs

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2013 / 12 Vol. 21; Iss. 12

Variation-Aware Aging Analysis in Digital ICs

Han, Sangwoo, Kim, Byung-Su, Kim, Juho
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
21
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2012.2228886
Date:
December, 2013
File:
PDF, 1.65 MB
english, 2013
Conversion to is in progress
Conversion to is failed