Depth Profiling of Organic Films with X-ray Photoelectron...

Analytical Chemistry 2008 / 05 Vol. 80; Iss. 9

Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C 60+ and Ar + Co-Sputtering

Yu, Bang-Ying, Chen, Ying-Yu, Wang, Wei-Ben, Hsu, Mao-Feng, Tsai, Shu-Ping, Lin, Wei-Chun, Lin, Yu-Chin, Jou, Jwo-Huei, Chu, Chih-Wei, Shyue, Jing-Jong
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Volume:
80
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac702626n
Date:
May, 2008
File:
PDF, 163 KB
english, 2008
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