Raman and XPS studies of CIGS/Mo interfaces under various...

Materials Letters 2014 / 12 Vol. 136

Raman and XPS studies of CIGS/Mo interfaces under various annealing temperatures

Han, Junfeng, Ouyang, Liangqi, Zhuang, Daming, Liao, Cheng, Liu, Jiang, Zhao, Ming, Cha, Li-mei, Besland, M.-P.
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Volume:
136
Language:
english
Journal:
Materials Letters
DOI:
10.1016/j.matlet.2014.08.087
Date:
December, 2014
File:
PDF, 1.04 MB
english, 2014
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