Single Event Hard Errors in SRAM Under Heavy Ion Irradiation
Haran, Avner, Barak, Joseph, David, David, Keren, Eitan, Refaeli, Nati, Rapaport, ShimshonVolume:
61
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2014.2345697
Date:
October, 2014
File:
PDF, 1.25 MB
english, 2014