Extending the Capability of STM Break Junction for...

Journal of the American Chemical Society 2008 / 10 Vol. 130; Iss. 40

Extending the Capability of STM Break Junction for Conductance Measurement of Atomic-Size Nanowires: An Electrochemical Strategy

Zhou, Xiao-Shun, Wei, Yi-Min, Liu, Ling, Chen, Zhao-Bin, Tang, Jing, Mao, Bing-Wei
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Volume:
130
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja8055276
Date:
October, 2008
File:
PDF, 568 KB
english, 2008
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