Order and defects of Langmuir-Blodgett films detected with the atomic force microscope
Peltonen, Jouko P. K., He, Pingsheng, Rosenholm, Jarl B.Volume:
114
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja00046a005
Date:
September, 1992
File:
PDF, 3.17 MB
english, 1992