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Analysis of crystalline perfection of pure and Mo-doped KTP crystals on different growth planes by high-resolution X-ray diffraction
Rajeev Gandhi, Jayavelu, Rathnakumari, Muthian, Muralimanohar, Pandarinathan, Sureshkumar, Palanivel, Bhagavannarayana, GodavarthiVolume:
47
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S1600576714006840
Date:
June, 2014
File:
PDF, 763 KB
english, 2014