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Ligand-Localized Electron Trapping at Sensitized Semiconductor Interfaces
Hoertz, Paul G., Thompson, David W., Friedman, Lee A., Meyer, Gerald J.Volume:
124
Language:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja0268478
Date:
August, 2002
File:
PDF, 70 KB
english, 2002