Chemically-Sensitive Imaging in Tapping Mode by Chemical Force Microscopy: Relationship between Phase Lag and Adhesion
Noy, Aleksandr, Sanders, Charles H., Vezenov, Dmitri V., Wong, Stanislaus S., Lieber, Charles M.Volume:
14
Language:
english
Journal:
Langmuir
DOI:
10.1021/la970948f
Date:
March, 1998
File:
PDF, 71 KB
english, 1998