Chemically-Sensitive Imaging in Tapping Mode by Chemical...

Chemically-Sensitive Imaging in Tapping Mode by Chemical Force Microscopy:  Relationship between Phase Lag and Adhesion

Noy, Aleksandr, Sanders, Charles H., Vezenov, Dmitri V., Wong, Stanislaus S., Lieber, Charles M.
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Volume:
14
Language:
english
Journal:
Langmuir
DOI:
10.1021/la970948f
Date:
March, 1998
File:
PDF, 71 KB
english, 1998
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