Effects of channel-length scaling on In[sub 2]O[sub 3] nanowire field effect transistors studied by conducting atomic force microscopy
Jo, Gunho, Maeng, Jongsun, Kim, Tae-Wook, Hong, Woong-Ki, Jo, Minseok, Hwang, Hyunsang, Lee, TakheeVolume:
90
Year:
2007
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.2728754
File:
PDF, 445 KB
english, 2007