[IEEE 2010 Third International Conference on Software Testing, Verification and Validation - Paris, France (2010.04.6-2010.04.10)] 2010 Third International Conference on Software Testing, Verification and Validation - Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
Perrouin, Gilles, Sen, Sagar, Klein, Jacques, Baudry, Benoit, Traon, Yves leYear:
2010
Language:
english
DOI:
10.1109/ICST.2010.43
File:
PDF, 1.38 MB
english, 2010