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[IEEE 2006 SICE-ICASE International Joint Conference - Busan Exhibition & Convention Center-BEXCO, Busan, Korea (2006.10.18-2006.10.21)] 2006 SICE-ICASE International Joint Conference - Automated Testing for Automotive Embedded Systems
Kum, Dae-hyun, Son, Joonwoo, Lee, Seon-bong, Wilson, IvanYear:
2006
Language:
english
DOI:
10.1109/SICE.2006.314687
File:
PDF, 5.30 MB
english, 2006