Current sustainability and electromigration of Pd, Sc and Y...

Nano-Micro Letters 2010 / 09 Vol. 2; Iss. 3

Current sustainability and electromigration of Pd, Sc and Y thin-films as potential interconnects

Yong Yang,Shengyong Xu,Sishen Xie,Lian-Mao Peng
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Volume:
2
Language:
english
Journal:
Nano-Micro Letters
DOI:
10.1007/BF03353639
Date:
September, 2010
File:
PDF, 583 KB
english, 2010
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