An improved compact model for CMOS cross-shaped Hall-effect...

Analog Integrated Circuits and Signal Processing 2012 / 12 Vol. 73; Iss. 3

An improved compact model for CMOS cross-shaped Hall-effect sensor including offset and temperature effects

Morgan Madec,Jean-Baptiste Kammerer…
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Volume:
73
Language:
english
Journal:
Analog Integrated Circuits and Signal Processing
DOI:
10.1007/s10470-012-9872-1
Date:
December, 2012
File:
PDF, 980 KB
english, 2012
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