Molecular Imaging Secondary Ion Mass Spectrometry for the...

Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold

Gillen, Greg., Bennett, Joe., Tarlov, Michael J., Burgess, Donald R. F.
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Volume:
66
Language:
english
Journal:
Analytical Chemistry
DOI:
10.1021/ac00085a036
Date:
July, 1994
File:
PDF, 1.71 MB
english, 1994
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