Complementary Charge Trapping and Ionic Migration in...

ACS Applied Materials & Interfaces 2013 / 02 Vol. 5; Iss. 4

Complementary Charge Trapping and Ionic Migration in Resistive Switching of Rare-Earth Manganite TbMnO 3

Cui, Yimin, Peng, Haiyang, Wu, Shuxiang, Wang, Rongming, Wu, Tom
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Volume:
5
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/am301769f
Date:
February, 2013
File:
PDF, 1.72 MB
english, 2013
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