[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Stability of PEEC models with respect to partial element accuracy
Ekman, J., Antonini, G., Orlandi, A., Ruehli, A.E.Volume:
1
Year:
2004
Language:
english
DOI:
10.1109/ISEMC.2004.1350039
File:
PDF, 440 KB
english, 2004