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Hydrogen Interaction with Point Defects in the Si-SiO2 Structures and its Influence on the Interface Properties
Kropman, Daniel, Mellikov, E., Kärner, T., Ugaste, Ü., Laas, Tony, Heinmaa, I., Abru, U., Medvid, ArthurVolume:
131-133
Year:
2008
Language:
english
Journal:
Solid State Phenomena
DOI:
10.4028/www.scientific.net/SSP.131-133.345
File:
PDF, 277 KB
english, 2008