![](/img/cover-not-exists.png)
[IEEE Comput. Soc. Press 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers - Santa Clara, CA, USA (11-14 Nov. 1991)] 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers - DIATEST: a fast diagnostic test pattern generator for combinational circuits
Gruning, T., Mahlstedt, U., Koopmeiners, H.Year:
1991
DOI:
10.1109/ICCAD.1991.185229
File:
PDF, 393 KB
1991