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AFM Force Mapping for Characterizing Patterns of Electrostatic Charges on SiO 2 Electrets
Zhang, Yiheng, Zhao, Dan, Tan, Xinxin, Cao, Tingbing, Zhang, XiVolume:
26
Language:
english
Journal:
Langmuir
DOI:
10.1021/la101290r
Date:
July, 2010
File:
PDF, 3.60 MB
english, 2010