Investigation of Temperature-Dependent Characteristics of...

IEEE Transactions on Electron Devices 2014 / 8 Vol. 61; Iss. 8

Investigation of Temperature-Dependent Characteristics of AlGaN/GaN MOS-HEMT by Using Hydrogen Peroxide Oxidation Technique

Han-Yin Liu,, Wei-Chou Hsu,, Ching-Sung Lee,, Bo-Yi Chou,, Yi-Bo Liao,, Meng-Hsueh Chiang,
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Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2327123
Date:
August, 2014
File:
PDF, 2.65 MB
english, 2014
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