[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Electrostatics and performance benchmarking using all types of III–V multi-gate FinFETs for sub 7nm technology node logic application

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