Extraction of AlGaN/GaN HEMT Gauge Factor in the Presence of Traps
Koehler, Andrew D, Gupta, Amit, Min Chu,, Parthasarathy, Srivatsan, Linthicum, Kevin J, Johnson, J Wayne, Nishida, Toshikazu, Thompson, Scott EVolume:
31
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2010.2048195
Date:
July, 2010
File:
PDF, 390 KB
english, 2010