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Robustness of high-fidelity Rydberg gates with single-site addressability
Goerz, Michael H., Halperin, Eli J., Aytac, Jon M., Koch, Christiane P., Whaley, K. BirgittaVolume:
90
Language:
english
Journal:
Physical Review A
DOI:
10.1103/PhysRevA.90.032329
Date:
September, 2014
File:
PDF, 1.79 MB
english, 2014