[IEEE 2010 IEEE/MTT-S International Microwave Symposium -...

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[IEEE 2010 IEEE/MTT-S International Microwave Symposium - MTT 2010 - Anaheim, CA, USA (2010.05.23-2010.05.28)] 2010 IEEE MTT-S International Microwave Symposium - Improved parameter extraction method for GaN HEMT on Si substrate

Jarndal, Anwar, Markos, Asd, Kompa, Gunter
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Year:
2010
Language:
english
DOI:
10.1109/MWSYM.2010.5514666
File:
PDF, 791 KB
english, 2010
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