[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Histogram Based Testing Strategy for ADC
Ting, Hsin-wen, Liu, Bin-da, Chang, Soon-jyhYear:
2006
Language:
english
DOI:
10.1109/ATS.2006.260992
File:
PDF, 320 KB
english, 2006