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Quality process modelling: An application to the continuous electrical resistance annealing of copper wire
Y.E. Shao, G. Runger, W.A. Wallace, F.F. Kraft, R.N. WrightVolume:
23
Year:
1992
Language:
english
Pages:
4
DOI:
10.1016/0360-8352(92)90088-2
File:
PDF, 335 KB
english, 1992