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[IEEE 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013 - Denver, CO, USA (2013.08.5-2013.08.9)] 2013 IEEE International Symposium on Electromagnetic Compatibility - Major error and sensitivity analysis for characterization of laminate dielectrics on PCB striplines
Rakov, Aleksei, Koledintseva, Marina, Drewniak, James, Hinaga, ScottYear:
2013
Language:
english
DOI:
10.1109/ISEMC.2013.6670529
File:
PDF, 1.11 MB
english, 2013