Negative exponential disparity based family of...

Journal of Statistical Computation and Simulation 2000 / 01 Vol. 65; Iss. 1-4

Negative exponential disparity based family of goodness-of-fit tests for multinomial models

Jeong, Dong-Bin, Sarkar, Sahadeb.
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Volume:
65
Language:
english
Journal:
Journal of Statistical Computation and Simulation
DOI:
10.1080/00949650008811989
Date:
January, 2000
File:
PDF, 935 KB
english, 2000
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