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Modeling and assessing the influence of linear energy transfer on multiple bit upset susceptibility
Geng, Chao, Liu, Jie, Xi, Kai, Zhang, Zhan-Gang, Gu, Song, Liu, Tian-QiVolume:
22
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/22/10/109501
Date:
October, 2013
File:
PDF, 457 KB
english, 2013