Deep Level Transient Spectroscopy of Defects in High-Energy...

Critical Reviews in Solid State and Material Sciences 2004 / 01 Vol. 29; Iss. 1

Deep Level Transient Spectroscopy of Defects in High-Energy Light-Particle Irradiated Si

Auret, F. Danie, Deenapanray, Prakash N.K.
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Volume:
29
Language:
english
Journal:
Critical Reviews in Solid State and Materials Sciences
DOI:
10.1080/10408430490442458
Date:
January, 2004
File:
PDF, 2.75 MB
english, 2004
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