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Multilayer capacitor margin stresses and electrode to dielectric thickness calculations
Carlson, William, Rutt, Truman, Wild, MichaelVolume:
21
Language:
english
Journal:
Ferroelectrics Letters Section
DOI:
10.1080/07315179608204737
Date:
April, 1996
File:
PDF, 352 KB
english, 1996