Simulation-aided investigation of beam hardening induced...

Measurement Science and Technology 2014 / 06 Vol. 25; Iss. 6

Simulation-aided investigation of beam hardening induced errors in CT dimensional metrology

Tan, Ye, Kiekens, Kim, Welkenhuyzen, Frank, Angel, J, De Chiffre, L, Kruth, Jean-Pierre, Dewulf, Wim
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Volume:
25
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/25/6/064014
Date:
June, 2014
File:
PDF, 1.56 MB
english, 2014
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