Determination of Si2p electron attenuation lengths in SiO2

Determination of Si2p electron attenuation lengths in SiO2

Julia E. Fulghum, Richard Stokell, Gary McGuire, Bijoy Patnaik, Ning Yu, Y.J. Zhao, Nalin Parikh
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Volume:
60
Year:
1992
Language:
english
Pages:
9
DOI:
10.1016/0368-2048(92)80038-a
File:
PDF, 663 KB
english, 1992
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