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[IEEE Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (20-22 March 2001)] Seventeenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.01CH37189) - Thermal-mechanical measurements and analysis of an advanced thermal interface material construction
Raiszadeh, F., Derian, E.Year:
2001
Language:
english
DOI:
10.1109/STHERM.2001.915147
File:
PDF, 1.42 MB
english, 2001