X-ray photoelectron diffraction from Si(111): short versus longer range structural sensitivity
G. Gewinner, U. Kafader, P. Wetzel, C. PirriVolume:
67
Year:
1994
Language:
english
Pages:
13
DOI:
10.1016/0368-2048(93)02046-o
File:
PDF, 1.23 MB
english, 1994