![](/img/cover-not-exists.png)
Change in Transfer and Low-Frequency Noise Characteristics of n-Channel Polysilicon TFTs Due to Hot-Carrier Degradation
A. Hatzopoulos, N. Archontas, N. Hastas, C. Dimitriadis, G. Kamarinos, N. Georgoulas, A. ThanailakisVolume:
25
Year:
2004
Language:
english
DOI:
10.1109/LED.2004.828555
File:
PDF, 145 KB
english, 2004