[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai,...

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[IEEE Comput. Soc Eighth Asian Test Symposium - Shanghai, China (16-18 Nov. 1999)] Proceedings Eighth Asian Test Symposium (ATS'99) - Failure analysis case studies using the IR-OBIRCH (infrared optical beam induced resistance change) method

Nikawa, K., Inoue, S., Morimoto, K., Sone, S.
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Year:
1999
Language:
english
DOI:
10.1109/ATS.1999.810781
File:
PDF, 341 KB
english, 1999
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