Nanowire Probes for High Resolution Combined Scanning Electrochemical Microscopy − Atomic Force Microscopy
Burt, David P., Wilson, Neil R., Weaver, John M. R., Dobson, Phillip S., Macpherson, Julie V.Volume:
5
Language:
english
Journal:
Nano Letters
DOI:
10.1021/nl050018d
Date:
April, 2005
File:
PDF, 209 KB
english, 2005